Improvement in in-plane localization precision of nanoparticles using interference analysis

Amihai Meiri, Carl G. Ebeling, Jason Martineau, Zeev Zalevsky, Jordan M. Gerton, Rajesh Menon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint

Dive into the research topics of 'Improvement in in-plane localization precision of nanoparticles using interference analysis'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science