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Improvement in in-plane localization precision of nanoparticles using interference analysis

  • Amihai Meiri
  • , Carl G. Ebeling
  • , Jason Martineau
  • , Zeev Zalevsky
  • , Jordan M. Gerton
  • , Rajesh Menon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationQELS - Fundamental Science, CLEO_QELS 2015
PublisherOptical Society of America
Pages1551p
ISBN (Electronic)9781557529688
DOIs
StatePublished - 4 May 2015
EventCLEO: QELS - Fundamental Science, CLEO_QELS 2015 - San Jose, United States
Duration: 10 May 201515 May 2015

Publication series

NameCLEO: QELS - Fundamental Science, CLEO_QELS 2015

Conference

ConferenceCLEO: QELS - Fundamental Science, CLEO_QELS 2015
Country/TerritoryUnited States
CitySan Jose
Period10/05/1515/05/15

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