@inproceedings{39b3e39b43e14af286f58b15d2b13eb4,
title = "Improvement in in-plane localization precision of nanoparticles using interference analysis",
abstract = "We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.",
author = "Amihai Meiri and Ebeling, {Carl G.} and Jason Martineau and Zeev Zalevsky and Gerton, {Jordan M.} and Rajesh Menon",
year = "2015",
month = may,
day = "4",
doi = "10.1364/cleo_at.2015.jw2a.88",
language = "אנגלית",
series = "CLEO: QELS - Fundamental Science, CLEO_QELS 2015",
publisher = "Optical Society of America",
pages = "1551p",
booktitle = "CLEO",
note = "CLEO: QELS - Fundamental Science, CLEO_QELS 2015 ; Conference date: 10-05-2015 Through 15-05-2015",
}