Improved Extended Depth of Focus Full Field Spectral Domain Optical Coherence Tomography

Alex Zlotnik, Yoed Abraham, Lior Liraz, Ibrahim Abdulhalim, Zeev Zalevsky

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In Optical Coherence Tomography (OCT), both high axial and lateral resolutions are desired. While axial (z-axis) resolution is achieved by a broadband source, lateral (x–y axes) resolution is achieved by high NA lenses. However, high NA objectives result in decreased depth of focus (DOF). The small DOF makes it difficult to obtain single shot imaging of biological samples having large lateral dimension. In this work we incorporate special interfering phase mask allowing to extend the DOF of an OCT system and to allow imaging of samples without axial scanning.
Original languageAmerican English
Title of host publicationConference on Laser Electro-Optics: Applications, OSA Technical Digest
PublisherScienceDirect
StatePublished - 2010

Bibliographical note

Place of conference:USA

Fingerprint

Dive into the research topics of 'Improved Extended Depth of Focus Full Field Spectral Domain Optical Coherence Tomography'. Together they form a unique fingerprint.

Cite this