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Imaging method and system with optimized extended depth of focus
Z. Zalevsky
(Inventor)
, A. Zlotnik (Inventor)
, I. Raveh (Inventor)
Bar-Ilan University - The Alexander Kofkin Faculty of Engineering
Electro-Optics (BIU Engineering)
Brien Holden Vision Institute
Research output
:
Patent
Overview
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Keyphrases
Extended Depth of Focus
100%
Imaging Methods
100%
Imaging Systems
100%
Encoder
100%
Imaging Lens
75%
Light Field
50%
Optical Processor
50%
Focus Modulation
50%
Dispersion Profile
50%
Modulation Transfer Function
50%
Optical Properties
25%
Optical Processing
25%
Engineering
Transfer Function
100%
Image Analysis
100%
Light Field
100%
Profile Dispersion
100%