Abstract
A time-lens can image signals in time and map ultrafast signals from frequency to time. The concept of time-lens is based on the duality between the diffraction of light in space and the dispersion of pulses in time, which arises from the similarity between the equations describing these two phenomena. In this paper we explain how to use time-lenses in order to perform high-resolution temporal imaging on non-classical ultrafast signals. Such a scheme can be used e.g. for diagnosing quantum cryptography schemes on optical fiber networks or assessing the performance of photonic quantum computers and simulators.
Original language | English |
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Title of host publication | Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II |
Editors | Selim M. Shahriar, Jacob Scheuer |
Publisher | SPIE |
ISBN (Electronic) | 9781510633551 |
DOIs | |
State | Published - 2020 |
Event | Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II 2020 - San Francisco, United States Duration: 1 Feb 2020 → 6 Feb 2020 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 11296 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II 2020 |
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Country/Territory | United States |
City | San Francisco |
Period | 1/02/20 → 6/02/20 |
Bibliographical note
Publisher Copyright:© 2020 SPIE.
Keywords
- four-wave mixing
- quantum imaging
- temporal imaging
- time-lens