High-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy

Yishai Klein, Alok K. Tripathi, Edward Strizhevsky, Flavio Capotondi, Dario De Angelis, Luca Giannessi, Matteo Pancaldi, Emanuele Pedersoli, Kevin C. Prince, Or Sefi, Young Yong Kim, Ivan A. Vartanyants, Sharon Shwartz

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet transient absorption spectroscopy at free-electron laser sources. To retrieve the sample response, our approach requires only an online spectrometer before the sample and a downstream bucket detector. We validate the method by measuring the absorption spectrum of silicon, silicon carbide, and silicon nitride membranes in the vicinity of the silicon L2,3 edge and by comparing the results with standard techniques for absorption measurements. Moreover, we show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response to optical pumps using a coarse energy scan with self-amplified spontaneous emission radiation.

Original languageEnglish
Article number053503
JournalPhysical Review A
Issue number5
StatePublished - May 2023

Bibliographical note

Publisher Copyright:
© 2023 American Physical Society.


Dive into the research topics of 'High-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy'. Together they form a unique fingerprint.

Cite this