Abstract
We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet transient absorption spectroscopy at free-electron laser sources. To retrieve the sample response, our approach requires only an online spectrometer before the sample and a downstream bucket detector. We validate the method by measuring the absorption spectrum of silicon, silicon carbide, and silicon nitride membranes in the vicinity of the silicon L2,3 edge and by comparing the results with standard techniques for absorption measurements. Moreover, we show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response to optical pumps using a coarse energy scan with self-amplified spontaneous emission radiation.
Original language | English |
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Article number | 053503 |
Number of pages | 12 |
Journal | Physical Review A |
Volume | 107 |
Issue number | 5 |
DOIs | |
State | Published - May 2023 |
Bibliographical note
Publisher Copyright:© 2023 American Physical Society.
Funding
Y.K. gratefully acknowledges the support of the Ministry of Science & Technologies, Israel. This work is supported by the Israel Science Foundation (ISF) (Grant No. 201/17).
Funders | Funder number |
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Israel Science Foundation | 201/17 |
Ministry of science and technology, Israel |