Abstract
In this paper, a method of two-dimensional fine-scanning with charge coupled device has been conducted to precisely measure spatial position and intensity distribution of small-scale focal spot (diameter in microns). The measurement accuracy of the small-scale focal spot position is better than 1 Âm when the fluctuations of the light energy and background noise are relatively small. The theoretical analysis is consistent with the experimental results.
Original language | English |
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Pages (from-to) | 177-183 |
Number of pages | 7 |
Journal | Laser and Particle Beams |
Volume | 31 |
Issue number | 1 |
DOIs | |
State | Published - 2013 |
Externally published | Yes |
Keywords
- Centroid position
- Charge coupled device
- High-precision measurement
- Relative intensity distribution
- Small-scale focal spot