TY - GEN
T1 - High performance InAlSb MWIR detectors operating at 100K and beyond
AU - Glozman, Alex
AU - Harush, Eli
AU - Jacobsohn, Eli
AU - Klin, Olga
AU - Klipstein, Philip
AU - Markovitz, Tuvy
AU - Nahum, Vered
AU - Saguy, Erez
AU - Oiknine-Schlesinger, Joelle
AU - Shtrichman, Itay
AU - Yassen, Michael
AU - Yofis, Boris
AU - Weiss, Eliezer
PY - 2006
Y1 - 2006
N2 - Over the past few years SCD has developed a new InAlSb diode technology based on Antimonide Based Compound Semiconductors (ABCS). In addition SCD has lead in the development of a new standard of silicon readout circuits based on digital processing. These are known as the "Sebastian" family of focal plane processors and are available in 384 × 480 and 512 × 640 formats. The combination of ABCS diode technology with digital readout capability highlights an important cornerstone of SCDs 3rd generation detector program. ABCS diode technology offers lower dark currents or higher operating temperatures in the 100K region while digital readouts provide very low noise and high immunity to external interference, combined with very high functionality. In this paper we present the current status of our ABCS-digital product development, in which the detectors are designed to provide improved performance characteristics for applications such as hand-held thermal imagers, missile seekers, airborne missile warning systems, long-range target identification and reconnaissance, etc. The most important Detector-Dewar-Cooler Assembly (DDCA) parameters are reviewed, according to each specific application. Benefits of these products include lower power consumption, lighter weight, higher signal-to-noise ratio, improved cooler reliability, faster mission readiness, longer mission times and more compact solutions for volume-critical applications. All these advantages are being offered without sacrificing the standard qualities of SCDs InSb Focal Plane Arrays (FPAs), such as excellent radiometric performance, image uniformity, high operability and soft-defect cosmetics.
AB - Over the past few years SCD has developed a new InAlSb diode technology based on Antimonide Based Compound Semiconductors (ABCS). In addition SCD has lead in the development of a new standard of silicon readout circuits based on digital processing. These are known as the "Sebastian" family of focal plane processors and are available in 384 × 480 and 512 × 640 formats. The combination of ABCS diode technology with digital readout capability highlights an important cornerstone of SCDs 3rd generation detector program. ABCS diode technology offers lower dark currents or higher operating temperatures in the 100K region while digital readouts provide very low noise and high immunity to external interference, combined with very high functionality. In this paper we present the current status of our ABCS-digital product development, in which the detectors are designed to provide improved performance characteristics for applications such as hand-held thermal imagers, missile seekers, airborne missile warning systems, long-range target identification and reconnaissance, etc. The most important Detector-Dewar-Cooler Assembly (DDCA) parameters are reviewed, according to each specific application. Benefits of these products include lower power consumption, lighter weight, higher signal-to-noise ratio, improved cooler reliability, faster mission readiness, longer mission times and more compact solutions for volume-critical applications. All these advantages are being offered without sacrificing the standard qualities of SCDs InSb Focal Plane Arrays (FPAs), such as excellent radiometric performance, image uniformity, high operability and soft-defect cosmetics.
KW - Antimonide Based Compound Semiconductors
KW - Digital Detector Dewar Cooler
KW - Digital Focal Plane Processor
KW - Focal Plane Array
KW - Indium Aluminum Antimonide
KW - Infrared Detector
KW - Molecular Beam Epitaxy
UR - http://www.scopus.com/inward/record.url?scp=33747725917&partnerID=8YFLogxK
U2 - 10.1117/12.667783
DO - 10.1117/12.667783
M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???
AN - SCOPUS:33747725917
SN - 0819462624
SN - 9780819462626
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Infrared Technology and Applications XXXII
T2 - Infrared Technology and Applications XXXII
Y2 - 17 April 2006 through 21 April 2006
ER -