Abstract
We utilize ghost spectroscopy for the measurement of photo-induced ultrafast dynamics using self-amplified spontaneous emission from free-electron lasers. We show that the spectral resolution is sufficient to detect small shifts in the L-edge of silicon.
| Original language | English |
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| Title of host publication | 2023 Conference on Lasers and Electro-Optics, CLEO 2023 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781957171258 |
| State | Published - 2023 |
| Event | 2023 Conference on Lasers and Electro-Optics, CLEO 2023 - San Jose, United States Duration: 7 May 2023 → 12 May 2023 |
Publication series
| Name | 2023 Conference on Lasers and Electro-Optics, CLEO 2023 |
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Conference
| Conference | 2023 Conference on Lasers and Electro-Optics, CLEO 2023 |
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| Country/Territory | United States |
| City | San Jose |
| Period | 7/05/23 → 12/05/23 |
Bibliographical note
Publisher Copyright:© Optica Publishing Group 2023 © 2023 The Author(s)