High energy-resolution transient ghost absorption spectroscopy

  • A. K. Tripathi
  • , Y. Klein
  • , E. Strizhevsky
  • , F. Capotondi
  • , D. D. Angelis
  • , L. Giannessi
  • , M. Pancaldi
  • , E. Pedersoli
  • , K. C. Prince
  • , O. Sefi
  • , Y. Y. Kim
  • , I. A. Vartanyants
  • , S. Shwartz

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We utilize ghost spectroscopy for the measurement of photo-induced ultrafast dynamics using self-amplified spontaneous emission from free-electron lasers. We show that the spectral resolution is sufficient to detect small shifts in the L-edge of silicon.

Original languageEnglish
Title of host publication2023 Conference on Lasers and Electro-Optics, CLEO 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171258
StatePublished - 2023
Event2023 Conference on Lasers and Electro-Optics, CLEO 2023 - San Jose, United States
Duration: 7 May 202312 May 2023

Publication series

Name2023 Conference on Lasers and Electro-Optics, CLEO 2023

Conference

Conference2023 Conference on Lasers and Electro-Optics, CLEO 2023
Country/TerritoryUnited States
CitySan Jose
Period7/05/2312/05/23

Bibliographical note

Publisher Copyright:
© Optica Publishing Group 2023 © 2023 The Author(s)

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