High energy-resolution transient ghost absorption spectroscopy

A. K. Tripathi, Y. Klein, E. Strizhevsky, F. Capotondi, D. D. Angelis, L. Giannessi, M. Pancaldi, E. Pedersoli, K. C. Prince, O. Sefi, Y. Y. Kim, I. A. Vartanyants, S. Shwartz

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We utilize ghost spectroscopy for the measurement of photo-induced ultrafast dynamics using self-amplified spontaneous emission from free-electron lasers. We show that the spectral resolution is sufficient to detect small shifts in the L-edge of silicon.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationFundamental Science, CLEO:FS 2023
PublisherOptical Society of America
ISBN (Electronic)9781957171258
DOIs
StatePublished - 2023
EventCLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023 - San Jose, United States
Duration: 7 May 202312 May 2023

Publication series

NameCLEO: Fundamental Science, CLEO:FS 2023

Conference

ConferenceCLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023
Country/TerritoryUnited States
CitySan Jose
Period7/05/2312/05/23

Bibliographical note

Publisher Copyright:
© Optica Publishing Group 2023, © 2023 The Author(s)

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