High energy-resolution transient ghost absorption spectroscopy

A. K. Tripathi; Y. Klein; E. Strizhevsky; F. Capotondi; D. D. Angelis; L. Giannessi; M. Pancaldi; E. Pedersoli; K. C. Prince; O. Sefi; Y. Y. Kim; I. A. Vartanyants; S. Shwartz

doi:10.1364/CLEO_FS.2023.fw3m.7

High energy-resolution transient ghost absorption spectroscopy

A. K. Tripathi, Y. Klein, E. Strizhevsky, F. Capotondi, D. D. Angelis, L. Giannessi, M. Pancaldi, E. Pedersoli, K. C. Prince, O. Sefi, Y. Y. Kim, I. A. Vartanyants, S. Shwartz

Department of Physics - at Bar-Ilan University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We utilize ghost spectroscopy for the measurement of photo-induced ultrafast dynamics using self-amplified spontaneous emission from free-electron lasers. We show that the spectral resolution is sufficient to detect small shifts in the L-edge of silicon.

Original language	English
Title of host publication	2023 Conference on Lasers and Electro-Optics, CLEO 2023
Subtitle of host publication	Fundamental Science, CLEO:FS 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
Number of pages	4
ISBN (Electronic)	9781957171258
DOIs	https://doi.org/10.1364/CLEO_FS.2023.fw3m.7
State	Published - 2023
Event	CLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023 - San Jose, United States Duration: 7 May 2023 → 12 May 2023

Publication series

Name	2023 Conference on Lasers and Electro-Optics, CLEO 2023

Conference

Conference	CLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023
Country/Territory	United States
City	San Jose
Period	7/05/23 → 12/05/23

Bibliographical note

Publisher Copyright:
© Optica Publishing Group 2023 © 2023 The Author(s)

Access to Document

10.1364/CLEO_FS.2023.fw3m.7

Cite this

Tripathi, A. K., Klein, Y., Strizhevsky, E., Capotondi, F., Angelis, D. D., Giannessi, L., Pancaldi, M., Pedersoli, E., Prince, K. C., Sefi, O., Kim, Y. Y., Vartanyants, I. A., & Shwartz, S. (2023). High energy-resolution transient ghost absorption spectroscopy. In 2023 Conference on Lasers and Electro-Optics, CLEO 2023: Fundamental Science, CLEO:FS 2023 Article FW3M.7 (2023 Conference on Lasers and Electro-Optics, CLEO 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1364/CLEO_FS.2023.fw3m.7

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title = "High energy-resolution transient ghost absorption spectroscopy",

abstract = "We utilize ghost spectroscopy for the measurement of photo-induced ultrafast dynamics using self-amplified spontaneous emission from free-electron lasers. We show that the spectral resolution is sufficient to detect small shifts in the L-edge of silicon.",

author = "Tripathi, {A. K.} and Y. Klein and E. Strizhevsky and F. Capotondi and Angelis, {D. D.} and L. Giannessi and M. Pancaldi and E. Pedersoli and Prince, {K. C.} and O. Sefi and Kim, {Y. Y.} and Vartanyants, {I. A.} and S. Shwartz",

note = "Publisher Copyright: {\textcopyright} Optica Publishing Group 2023 {\textcopyright} 2023 The Author(s); CLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023 ; Conference date: 07-05-2023 Through 12-05-2023",

year = "2023",

doi = "10.1364/CLEO_FS.2023.fw3m.7",

language = "אנגלית",

series = "2023 Conference on Lasers and Electro-Optics, CLEO 2023",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2023 Conference on Lasers and Electro-Optics, CLEO 2023",

address = "ארצות הברית",

}

Tripathi, AK, Klein, Y, Strizhevsky, E, Capotondi, F, Angelis, DD, Giannessi, L, Pancaldi, M, Pedersoli, E, Prince, KC, Sefi, O, Kim, YY, Vartanyants, IA & Shwartz, S 2023, High energy-resolution transient ghost absorption spectroscopy. in 2023 Conference on Lasers and Electro-Optics, CLEO 2023: Fundamental Science, CLEO:FS 2023., FW3M.7, 2023 Conference on Lasers and Electro-Optics, CLEO 2023, Institute of Electrical and Electronics Engineers Inc., CLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023, San Jose, United States, 7/05/23. https://doi.org/10.1364/CLEO_FS.2023.fw3m.7

High energy-resolution transient ghost absorption spectroscopy. / Tripathi, A. K.; Klein, Y.; Strizhevsky, E. et al.
2023 Conference on Lasers and Electro-Optics, CLEO 2023: Fundamental Science, CLEO:FS 2023. Institute of Electrical and Electronics Engineers Inc., 2023. FW3M.7 (2023 Conference on Lasers and Electro-Optics, CLEO 2023).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Capotondi, F.

AU - Angelis, D. D.

AU - Giannessi, L.

AU - Pancaldi, M.

AU - Pedersoli, E.

AU - Prince, K. C.

AU - Sefi, O.

AU - Kim, Y. Y.

AU - Vartanyants, I. A.

AU - Shwartz, S.

PY - 2023

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AB - We utilize ghost spectroscopy for the measurement of photo-induced ultrafast dynamics using self-amplified spontaneous emission from free-electron lasers. We show that the spectral resolution is sufficient to detect small shifts in the L-edge of silicon.

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BT - 2023 Conference on Lasers and Electro-Optics, CLEO 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - CLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023

Y2 - 7 May 2023 through 12 May 2023

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Tripathi AK, Klein Y, Strizhevsky E, Capotondi F, Angelis DD, Giannessi L et al. High energy-resolution transient ghost absorption spectroscopy. In 2023 Conference on Lasers and Electro-Optics, CLEO 2023: Fundamental Science, CLEO:FS 2023. Institute of Electrical and Electronics Engineers Inc. 2023. FW3M.7. (2023 Conference on Lasers and Electro-Optics, CLEO 2023). doi: 10.1364/CLEO_FS.2023.fw3m.7

High energy-resolution transient ghost absorption spectroscopy

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