FRET-based scanning probe microscopy with a donor dye coated AFM tip

Basanth S. Kalanoor; Shirly Berezin; Omree Kapon; Yaakov R. Tischler

FRET-based scanning probe microscopy with a donor dye coated AFM tip

Basanth S. Kalanoor, Shirly Berezin, Omree Kapon, Yaakov R. Tischler

Department of Chemistry

Bar-Ilan University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A FRET-based method of near-field fluorescence lifetime imaging is developed. Lumogen dye attached to the apex of an AFM tip acts as a nanometeric light source for exciting the sample via non-radiative energy transfer.

Original language	English
Title of host publication	2015 Conference on Lasers and Electro-Optics, CLEO 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781557529688
State	Published - 10 Aug 2015
Event	Conference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States Duration: 10 May 2015 → 15 May 2015

Publication series

Name	Conference on Lasers and Electro-Optics Europe - Technical Digest
Volume	2015-August

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO 2015
Country/Territory	United States
City	San Jose
Period	10/05/15 → 15/05/15

Bibliographical note

Publisher Copyright:
© 2015 OSA.

Keywords

Excitons
Fluorescence
Image resolution
Microscopy
Optical imaging
Optical microscopy

Cite this

@inproceedings{45702d3d89fe4760b74bbd31b5a8bbab,

title = "FRET-based scanning probe microscopy with a donor dye coated AFM tip",

abstract = "A FRET-based method of near-field fluorescence lifetime imaging is developed. Lumogen dye attached to the apex of an AFM tip acts as a nanometeric light source for exciting the sample via non-radiative energy transfer.",

keywords = "Excitons, Fluorescence, Image resolution, Microscopy, Optical imaging, Optical microscopy",

author = "Kalanoor, {Basanth S.} and Shirly Berezin and Omree Kapon and Tischler, {Yaakov R.}",

note = "Publisher Copyright: {\textcopyright} 2015 OSA.; Conference on Lasers and Electro-Optics, CLEO 2015 ; Conference date: 10-05-2015 Through 15-05-2015",

year = "2015",

month = aug,

day = "10",

language = "אנגלית",

series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2015 Conference on Lasers and Electro-Optics, CLEO 2015",

address = "ארצות הברית",

}

Kalanoor, BS, Berezin, S, Kapon, O & Tischler, YR 2015, FRET-based scanning probe microscopy with a donor dye coated AFM tip. in 2015 Conference on Lasers and Electro-Optics, CLEO 2015., 7183028, Conference on Lasers and Electro-Optics Europe - Technical Digest, vol. 2015-August, Institute of Electrical and Electronics Engineers Inc., Conference on Lasers and Electro-Optics, CLEO 2015, San Jose, United States, 10/05/15.

FRET-based scanning probe microscopy with a donor dye coated AFM tip. / Kalanoor, Basanth S.; Berezin, Shirly; Kapon, Omree et al.
2015 Conference on Lasers and Electro-Optics, CLEO 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7183028 (Conference on Lasers and Electro-Optics Europe - Technical Digest; Vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - FRET-based scanning probe microscopy with a donor dye coated AFM tip

AU - Kalanoor, Basanth S.

AU - Berezin, Shirly

AU - Kapon, Omree

AU - Tischler, Yaakov R.

PY - 2015/8/10

Y1 - 2015/8/10

N2 - A FRET-based method of near-field fluorescence lifetime imaging is developed. Lumogen dye attached to the apex of an AFM tip acts as a nanometeric light source for exciting the sample via non-radiative energy transfer.

AB - A FRET-based method of near-field fluorescence lifetime imaging is developed. Lumogen dye attached to the apex of an AFM tip acts as a nanometeric light source for exciting the sample via non-radiative energy transfer.

KW - Excitons

KW - Fluorescence

KW - Image resolution

KW - Microscopy

KW - Optical imaging

KW - Optical microscopy

UR - http://www.scopus.com/inward/record.url?scp=84954058500&partnerID=8YFLogxK

M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???

AN - SCOPUS:84954058500

T3 - Conference on Lasers and Electro-Optics Europe - Technical Digest

BT - 2015 Conference on Lasers and Electro-Optics, CLEO 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - Conference on Lasers and Electro-Optics, CLEO 2015

Y2 - 10 May 2015 through 15 May 2015

ER -

FRET-based scanning probe microscopy with a donor dye coated AFM tip

Abstract

Publication series

Conference

Bibliographical note

Keywords

Other files and links

Fingerprint

Cite this