Abstract
The frequency and temperature dependence of mesoscopic fluctuations in the electrical polarizability of thin disordered films are calculated. The magnitude of those fluctuations relative to the static polarizability increases due to the ineffectiveness of screening processes at high frequencies. This increase may simplify experimental attempts to measure these fluctuations.
| Original language | English |
|---|---|
| Pages (from-to) | 263-265 |
| Number of pages | 3 |
| Journal | Solid State Communications |
| Volume | 88 |
| Issue number | 3 |
| DOIs | |
| State | Published - Oct 1993 |
Bibliographical note
Funding Information:Acknowledgements - We would like to thank B.L. Altshuler for motivating this work and for very useful discussions. RB would like to thank the Alon Foundation for financial support.
Funding
Acknowledgements - We would like to thank B.L. Altshuler for motivating this work and for very useful discussions. RB would like to thank the Alon Foundation for financial support.
| Funders | Funder number |
|---|---|
| Alon Foundation |