TY - JOUR
T1 - Four-point probe electrical resistivity scanning system for large area conductivity and activation energy mapping
AU - Shimanovich, Klimentiy
AU - Bouhadana, Yaniv
AU - Keller, David A.
AU - Rühle, Sven
AU - Anderson, Assaf Y.
AU - Zaban, Arie
PY - 2014/5
Y1 - 2014/5
N2 - The electrical properties of metal oxides play a crucial role in the development of new photovoltaic (PV) systems. Here we demonstrate a general approach for the determination and analysis of these properties in thin films of new metal oxide based PV materials. A high throughput electrical scanning system, which facilitates temperature dependent measurements at different atmospheres for highly resistive samples, was designed and constructed. The instrument is capable of determining conductivity and activation energy values for relatively large sample areas, of about 72 × 72 mm2, with the implementation of geometrical correction factors. The efficiency of our scanning system was tested using two different samples of CuO and commercially available Fluorine doped tin oxide coated glass substrates. Our high throughput tool was able to identify the electrical properties of both resistive metal oxide thin film samples with high precision and accuracy. The scanning system enabled us to gain insight into transport mechanisms with novel compositions and to use those insights to make smart choices when choosing materials for our multilayer thin film all oxide photovoltaic cells.
AB - The electrical properties of metal oxides play a crucial role in the development of new photovoltaic (PV) systems. Here we demonstrate a general approach for the determination and analysis of these properties in thin films of new metal oxide based PV materials. A high throughput electrical scanning system, which facilitates temperature dependent measurements at different atmospheres for highly resistive samples, was designed and constructed. The instrument is capable of determining conductivity and activation energy values for relatively large sample areas, of about 72 × 72 mm2, with the implementation of geometrical correction factors. The efficiency of our scanning system was tested using two different samples of CuO and commercially available Fluorine doped tin oxide coated glass substrates. Our high throughput tool was able to identify the electrical properties of both resistive metal oxide thin film samples with high precision and accuracy. The scanning system enabled us to gain insight into transport mechanisms with novel compositions and to use those insights to make smart choices when choosing materials for our multilayer thin film all oxide photovoltaic cells.
UR - http://www.scopus.com/inward/record.url?scp=84899889122&partnerID=8YFLogxK
U2 - 10.1063/1.4873353
DO - 10.1063/1.4873353
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AN - SCOPUS:84899889122
SN - 0034-6748
VL - 85
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 5
M1 - 055103
ER -
