Flourescence detection of surface exafs

Steve M. Heald, Edward Keller, Edward A. Stern

Research output: Contribution to journalArticlepeer-review

104 Scopus citations


The possibilities for flourescence detection of surface EXAFS are studied using thin films of gold on various substrates. For glancing incidence angles it is found that excellent signal to noise ratios can be obtained even for submonolayer films, demonstrating that the technique should have wide applicability to surface and near surface systems. In many cases the signal to noise is superior to electron detection techniques, and its sensitivity suggests the method may also be useful for detection of trace elements on surfaces.

Original languageEnglish
Pages (from-to)155-158
Number of pages4
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Issue number3
StatePublished - 25 Jun 1984
Externally publishedYes

Bibliographical note

Funding Information:
We would like to acknowledge the help of R. DiNardo in preparing the samples, A. Hansen and K. Jones for the Rutherford backscattering measurements, and J. Tranquada for help in obtaining the data. The CHESS staff is also thanked for their generous help. This work was supported in part by the Materials Sciences Division of DOE under Contract Nos. DE-AS05-80-ER10742 and DE-AC02-76CH00016 and by the National Science Foundation under grant DMR-80-22221.


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