Flicker Noise Effects on Analog Circuits in Intel Microprocessors

Original language	American English
Title of host publication	Intel Design and Test Technology Conference
State	Published - 2007

Bibliographical note

Place of conference:Intel - USA

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Shor, J. (2007). Flicker Noise Effects on Analog Circuits in Intel Microprocessors. In Intel Design and Test Technology Conference

Shor, J. / Flicker Noise Effects on Analog Circuits in Intel Microprocessors. Intel Design and Test Technology Conference. 2007.

@inproceedings{0be4bc8e02234822b7669e060e0e5618,

title = "Flicker Noise Effects on Analog Circuits in Intel Microprocessors",

author = "J. Shor",

note = "Place of conference:Intel - USA",

year = "2007",

language = "American English",

booktitle = "Intel Design and Test Technology Conference",

}

Shor, J 2007, Flicker Noise Effects on Analog Circuits in Intel Microprocessors. in Intel Design and Test Technology Conference.

Flicker Noise Effects on Analog Circuits in Intel Microprocessors. / Shor, J.
Intel Design and Test Technology Conference. 2007.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Flicker Noise Effects on Analog Circuits in Intel Microprocessors

AU - Shor, J.

N1 - Place of conference:Intel - USA

PY - 2007

Y1 - 2007

M3 - Conference contribution

BT - Intel Design and Test Technology Conference

ER -

Shor J. Flicker Noise Effects on Analog Circuits in Intel Microprocessors. In Intel Design and Test Technology Conference. 2007