Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculations

  • J. C. Woicik
  • , E. L. Shirley
  • , C. S. Hellberg
  • , K. E. Andersen
  • , S. Sambasivan
  • , D. A. Fischer
  • , B. D. Chapman
  • , E. A. Stern
  • , P. Ryan
  • , D. L. Ederer
  • , H. Li

Research output: Contribution to journalArticlepeer-review

64 Scopus citations

Abstract

Ti K and Ti L2,3 x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth.

Original languageEnglish
Article number140103
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume75
Issue number14
DOIs
StatePublished - 24 Apr 2007
Externally publishedYes

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