Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculations

J. C. Woicik; E. L. Shirley; C. S. Hellberg; K. E. Andersen; S. Sambasivan; D. A. Fischer; B. D. Chapman; E. A. Stern; P. Ryan; D. L. Ederer; H. Li

doi:10.1103/physrevb.75.140103

Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculations

J. C. Woicik, E. L. Shirley, C. S. Hellberg, K. E. Andersen, S. Sambasivan, D. A. Fischer, B. D. Chapman, E. A. Stern, P. Ryan, D. L. Ederer, H. Li

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Abstract

Ti K and Ti L2,3 x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth.

Original language	English
Article number	140103
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	75
Issue number	14
DOIs	https://doi.org/10.1103/physrevb.75.140103
State	Published - 24 Apr 2007
Externally published	Yes

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Woicik, J. C., Shirley, E. L., Hellberg, C. S., Andersen, K. E., Sambasivan, S., Fischer, D. A., Chapman, B. D., Stern, E. A., Ryan, P., Ederer, D. L., & Li, H. (2007). Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculations. Physical Review B - Condensed Matter and Materials Physics, 75(14), Article 140103. https://doi.org/10.1103/physrevb.75.140103

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abstract = "Ti K and Ti L2,3 x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth.",

author = "Woicik, {J. C.} and Shirley, {E. L.} and Hellberg, {C. S.} and Andersen, {K. E.} and S. Sambasivan and Fischer, {D. A.} and Chapman, {B. D.} and Stern, {E. A.} and P. Ryan and Ederer, {D. L.} and H. Li",

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doi = "10.1103/physrevb.75.140103",

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Woicik, JC, Shirley, EL, Hellberg, CS, Andersen, KE, Sambasivan, S, Fischer, DA, Chapman, BD, Stern, EA, Ryan, P, Ederer, DL & Li, H 2007, 'Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculations', Physical Review B - Condensed Matter and Materials Physics, vol. 75, no. 14, 140103. https://doi.org/10.1103/physrevb.75.140103

Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculations. / Woicik, J. C.; Shirley, E. L.; Hellberg, C. S. et al.
In: Physical Review B - Condensed Matter and Materials Physics, Vol. 75, No. 14, 140103, 24.04.2007.

Research output: Contribution to journal › Article › peer-review

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AU - Andersen, K. E.

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AU - Fischer, D. A.

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AU - Stern, E. A.

AU - Ryan, P.

AU - Ederer, D. L.

AU - Li, H.

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AB - Ti K and Ti L2,3 x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth.

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Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculations

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