Fault tolerance of decomposed PLAs

O. Keren, I. Levin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The paper deals with the fault tolerance of finite state machines (FSMs) implemented by nanoelectronic programmable logic arrays (PLAs). The paper studies a fault tolerant nano-PLA structure, which is based on implementing an initial FSM in a form of three interacting dense PLAs. The paper provides experimental benchmarks results for estimation of fault tolerance properties of the proposed solution. The results indicate a high efficiency of the proposed decomposition approach.

Original languageEnglish
Title of host publicationProceedings of IEEE East-West Design and Test Symposium, EWDTS'10
Pages86-91
Number of pages6
DOIs
StatePublished - 2010
EventIEEE East-West Design and Test Symposium, EWDTS'10 - St. Petersburg, Russian Federation
Duration: 17 Sep 201020 Sep 2010

Publication series

NameProceedings of IEEE East-West Design and Test Symposium, EWDTS'10

Conference

ConferenceIEEE East-West Design and Test Symposium, EWDTS'10
Country/TerritoryRussian Federation
CitySt. Petersburg
Period17/09/1020/09/10

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