Abstract
Single crystal diamond offers superior properties for MEMS applications to polycrystalline forms of this material. Here, a process based solely on focussed ion beam milling (Ga), has been used to fabricate nanometre-width diamond cantilevers we lengths of several tens of microns. The procedure results in low damage structures with little Ga incorporation, following post-fabrication annealing. The triangular profile of a cantilever produced using this technique is shown, theoretically, to have a factor of three improved defection response to a load typically encountered during chemical sensing compared to a conventional rectangular lever of similar dimensions.
Original language | English |
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Pages (from-to) | 742-747 |
Number of pages | 6 |
Journal | Diamond and Related Materials |
Volume | 19 |
Issue number | 7-9 |
DOIs | |
State | Published - Jul 2010 |
Externally published | Yes |
Keywords
- Diamond
- FIB
- MEMS
- Sensors