Eye-Tracking patterns as a tool to identify and classify cognitive styles

Original language	American English
State	Published - 2015
Event	International Neuropsychological Society (INS) Conference, Denver, USA - International Neuropsychological Society (INS), Denver, United States Duration: 4 Feb 2015 → 7 Feb 2015

Conference

Conference	International Neuropsychological Society (INS) Conference, Denver, USA
Country/Territory	United States
City	Denver
Period	4/02/15 → 7/02/15

Activities

• 1 Invited talk

Activities per year

• Conference Contributed

  Vakil, E. (Invited speaker)

  4 Feb 2015 → 7 Feb 2015

  Activity: Talk or presentation › Invited talk

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Nitzan-Tamar, O., Kramarski, B., & Vakil, E. (2015). Eye-Tracking patterns as a tool to identify and classify cognitive styles. Paper presented at International Neuropsychological Society (INS) Conference, Denver, USA, Denver, United States.

Nitzan-Tamar, O. ; Kramarski, B. ; Vakil, E. / Eye-Tracking patterns as a tool to identify and classify cognitive styles. Paper presented at International Neuropsychological Society (INS) Conference, Denver, USA, Denver, United States.

@conference{1cd5f4c33653449094f5bfe80c685c36,

title = "Eye-Tracking patterns as a tool to identify and classify cognitive styles",

author = "O. Nitzan-Tamar and B. Kramarski and E. Vakil",

year = "2015",

language = "American English",

note = "International Neuropsychological Society (INS) Conference, Denver, USA ; Conference date: 04-02-2015 Through 07-02-2015",

}

Nitzan-Tamar, O, Kramarski, B & Vakil, E 2015, 'Eye-Tracking patterns as a tool to identify and classify cognitive styles', Paper presented at International Neuropsychological Society (INS) Conference, Denver, USA, Denver, United States, 4/02/15 - 7/02/15.

Eye-Tracking patterns as a tool to identify and classify cognitive styles. / Nitzan-Tamar, O.; Kramarski, B.; Vakil, E.
2015. Paper presented at International Neuropsychological Society (INS) Conference, Denver, USA, Denver, United States.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Eye-Tracking patterns as a tool to identify and classify cognitive styles

AU - Nitzan-Tamar, O.

AU - Kramarski, B.

AU - Vakil, E.

PY - 2015

Y1 - 2015

M3 - Paper

T2 - International Neuropsychological Society (INS) Conference, Denver, USA

Y2 - 4 February 2015 through 7 February 2015

ER -

Nitzan-Tamar O, Kramarski B, Vakil E. Eye-Tracking patterns as a tool to identify and classify cognitive styles. 2015. Paper presented at International Neuropsychological Society (INS) Conference, Denver, USA, Denver, United States.