Extending the depth of focus for enhanced three-dimensional imaging and profilometry: An overview

Alex Zlotnik; Shai Ben-Yaish; Zeev Zalevsky

doi:10.1364/ao.48.00h105

Extending the depth of focus for enhanced three-dimensional imaging and profilometry: An overview

Alex Zlotnik, Shai Ben-Yaish, Zeev Zalevsky

Bar-Ilan University

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.

Original language	English
Pages (from-to)	H105-H112
Journal	Applied Optics
Volume	48
Issue number	34
DOIs	https://doi.org/10.1364/ao.48.00h105
State	Published - 1 Dec 2009

Access to Document

10.1364/ao.48.00h105

Cite this

@article{5ec6619f4d9546a7acab8417d56498eb,

title = "Extending the depth of focus for enhanced three-dimensional imaging and profilometry: An overview",

abstract = "We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.",

author = "Alex Zlotnik and Shai Ben-Yaish and Zeev Zalevsky",

year = "2009",

month = dec,

day = "1",

doi = "10.1364/ao.48.00h105",

language = "אנגלית",

volume = "48",

pages = "H105--H112",

journal = "Applied Optics",

issn = "1559-128X",

publisher = "Optica Publishing Group",

number = "34",

}

TY - JOUR

T1 - Extending the depth of focus for enhanced three-dimensional imaging and profilometry

T2 - An overview

AU - Zlotnik, Alex

AU - Ben-Yaish, Shai

AU - Zalevsky, Zeev

PY - 2009/12/1

Y1 - 2009/12/1

N2 - We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.

AB - We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.

UR - http://www.scopus.com/inward/record.url?scp=73649136838&partnerID=8YFLogxK

U2 - 10.1364/ao.48.00h105

DO - 10.1364/ao.48.00h105

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

C2 - 19956280

AN - SCOPUS:73649136838

SN - 1559-128X

VL - 48

SP - H105-H112

JO - Applied Optics

JF - Applied Optics

IS - 34

ER -

Extending the depth of focus for enhanced three-dimensional imaging and profilometry: An overview

Abstract

Access to Document

Other files and links

Fingerprint

Cite this