Extended x-ray-absorption fine-structure technique. II. Experimental practice and selected results

F. W. Lytle, D. E. Sayers, E. A. Stern

Research output: Contribution to journalArticlepeer-review

529 Scopus citations

Abstract

A technique is presented for obtaining extended x-ray-absorption fine structure (EXAFS) using a conventional, horizontal, x-ray diffractometer. Preparation of monochromator crystals, spectrometer alignment, counting techniques, evaluation of the energy scale and data normalization techniques are discussed. EXAFS spectra from a wide variety of materials are then presented to show the variability of the effect and interplay between various parameters of the theory. A final section illustrates a simple graphical scheme to obtain a first-neighbor distance from EXAFS data.

Original languageEnglish
Pages (from-to)4825-4835
Number of pages11
JournalPhysical Review B
Volume11
Issue number12
DOIs
StatePublished - 1975
Externally publishedYes

Bibliographical note

Funding Information:
Research supported by the National Science Foundation.

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