A technique is presented for obtaining extended x-ray-absorption fine structure (EXAFS) using a conventional, horizontal, x-ray diffractometer. Preparation of monochromator crystals, spectrometer alignment, counting techniques, evaluation of the energy scale and data normalization techniques are discussed. EXAFS spectra from a wide variety of materials are then presented to show the variability of the effect and interplay between various parameters of the theory. A final section illustrates a simple graphical scheme to obtain a first-neighbor distance from EXAFS data.
|Number of pages||11|
|Journal||Physical Review B|
|State||Published - 1975|
Bibliographical noteFunding Information:
Research supported by the National Science Foundation.