Experimental observation of depairing phenomenon in superconducting tin films

Anil Kumar Bhatnagar, Edward A. Stern

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

The gradual decrease to zero of supercurrent due to depairing in thin tin films has been observed as a function of external magnetic field in reasonable agreement with theory.

Original languageEnglish
Pages (from-to)1061-1064
Number of pages4
JournalPhysical Review Letters
Volume21
Issue number15
DOIs
StatePublished - 1968
Externally publishedYes

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