Abstract
An improved extended energy loss fine structure spectroscopy (EXELFS) data analysis technique is presented. Aluminum was used as sample due to its resistance to electron radiation. The results derived from the experiment is discussed. Due to the improved EELS data acquisition, CCGV can be corrected and statistical fluctuation could reach a level lower than in the fine structure.
| Original language | English |
|---|---|
| Pages (from-to) | 584-585 |
| Number of pages | 2 |
| Journal | Proceedings - Annual Meeting, Microscopy Society of America |
| State | Published - 1993 |
| Externally published | Yes |
| Event | Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: 1 Aug 1993 → 6 Aug 1993 |