EXELFS revisited: an improved data analysis technique

Maoxu Qian, Mehmet Sarikaya, Edward A. Stern

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations


An improved extended energy loss fine structure spectroscopy (EXELFS) data analysis technique is presented. Aluminum was used as sample due to its resistance to electron radiation. The results derived from the experiment is discussed. Due to the improved EELS data acquisition, CCGV can be corrected and statistical fluctuation could reach a level lower than in the fine structure.

Original languageEnglish
Pages (from-to)584-585
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - 1993
Externally publishedYes
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: 1 Aug 19936 Aug 1993


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