EXELFS χ-data renormalization

Maoxu Qian; Mehmet Sarikaya; Edward A. Stern

doi:10.1016/S0304-3991(97)00021-1

EXELFS χ-data renormalization

Maoxu Qian, Mehmet Sarikaya, Edward A. Stern

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

In this paper, a procedure developed for accurate modeling of the background of core edges in electron energy loss spectroscopy (EELS) is described. This procedure is necessary for improving data analysis technique used in extended energy loss fine structure (EXELFS) spectroscopy via the adaptation of X-ray absorption fine structure (XAFS) analysis programs. With the improved background modeling, it now becomes possible to renormalize the EXELFS χ-data and to ensure the correct use of the XAFS programs for EXELFS analysis.

Original language	English
Pages (from-to)	163-171
Number of pages	9
Journal	Ultramicroscopy
Volume	68
Issue number	3
DOIs	https://doi.org/10.1016/S0304-3991(97)00021-1
State	Published - Jul 1997
Externally published	Yes

Bibliographical note

Funding Information:
The authors would like to thank R. A. C. M. M. Van Swaaij and J. Bezemer for supplying samples and many helpful discussions, and A. R. Hepburn, A. K. Browne and J. Jansen for valuable conversations and technical advice. This work was carried out, in part, under the ISC programme of the European Commission, contract CI1 *-CT93-0039.

Keywords

Debye- Waller factor
Electron energy loss spectroscopy (EELS)
Extended energy loss fine structure (EXELFS) spectroscopy
Near neighbor
Transmission electron microscopy (TEM)
X-ray absorption fine structure (XAFS) analysis
χ-data

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10.1016/S0304-3991(97)00021-1

Cite this

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title = "EXELFS χ-data renormalization",

abstract = "In this paper, a procedure developed for accurate modeling of the background of core edges in electron energy loss spectroscopy (EELS) is described. This procedure is necessary for improving data analysis technique used in extended energy loss fine structure (EXELFS) spectroscopy via the adaptation of X-ray absorption fine structure (XAFS) analysis programs. With the improved background modeling, it now becomes possible to renormalize the EXELFS χ-data and to ensure the correct use of the XAFS programs for EXELFS analysis.",

keywords = "Debye- Waller factor, Electron energy loss spectroscopy (EELS), Extended energy loss fine structure (EXELFS) spectroscopy, Near neighbor, Transmission electron microscopy (TEM), X-ray absorption fine structure (XAFS) analysis, χ-data",

author = "Maoxu Qian and Mehmet Sarikaya and Stern, {Edward A.}",

note = "Funding Information: The authors would like to thank R. A. C. M. M. Van Swaaij and J. Bezemer for supplying samples and many helpful discussions, and A. R. Hepburn, A. K. Browne and J. Jansen for valuable conversations and technical advice. This work was carried out, in part, under the ISC programme of the European Commission, contract CI1 *-CT93-0039.",

year = "1997",

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doi = "10.1016/S0304-3991(97)00021-1",

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AU - Qian, Maoxu

AU - Sarikaya, Mehmet

AU - Stern, Edward A.

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PY - 1997/7

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N2 - In this paper, a procedure developed for accurate modeling of the background of core edges in electron energy loss spectroscopy (EELS) is described. This procedure is necessary for improving data analysis technique used in extended energy loss fine structure (EXELFS) spectroscopy via the adaptation of X-ray absorption fine structure (XAFS) analysis programs. With the improved background modeling, it now becomes possible to renormalize the EXELFS χ-data and to ensure the correct use of the XAFS programs for EXELFS analysis.

AB - In this paper, a procedure developed for accurate modeling of the background of core edges in electron energy loss spectroscopy (EELS) is described. This procedure is necessary for improving data analysis technique used in extended energy loss fine structure (EXELFS) spectroscopy via the adaptation of X-ray absorption fine structure (XAFS) analysis programs. With the improved background modeling, it now becomes possible to renormalize the EXELFS χ-data and to ensure the correct use of the XAFS programs for EXELFS analysis.

KW - Debye- Waller factor

KW - Electron energy loss spectroscopy (EELS)

KW - Extended energy loss fine structure (EXELFS) spectroscopy

KW - Near neighbor

KW - Transmission electron microscopy (TEM)

KW - X-ray absorption fine structure (XAFS) analysis

KW - χ-data

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SN - 0304-3991

VL - 68

SP - 163

EP - 171

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3

ER -

EXELFS χ-data renormalization

Abstract

Bibliographical note

Keywords

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