EXELFS χ-data renormalization

Maoxu Qian, Mehmet Sarikaya, Edward A. Stern

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

In this paper, a procedure developed for accurate modeling of the background of core edges in electron energy loss spectroscopy (EELS) is described. This procedure is necessary for improving data analysis technique used in extended energy loss fine structure (EXELFS) spectroscopy via the adaptation of X-ray absorption fine structure (XAFS) analysis programs. With the improved background modeling, it now becomes possible to renormalize the EXELFS χ-data and to ensure the correct use of the XAFS programs for EXELFS analysis.

Original languageEnglish
Pages (from-to)163-171
Number of pages9
JournalUltramicroscopy
Volume68
Issue number3
DOIs
StatePublished - Jul 1997
Externally publishedYes

Bibliographical note

Funding Information:
The authors would like to thank R. A. C. M. M. Van Swaaij and J. Bezemer for supplying samples and many helpful discussions, and A. R. Hepburn, A. K. Browne and J. Jansen for valuable conversations and technical advice. This work was carried out, in part, under the ISC programme of the European Commission, contract CI1 *-CT93-0039.

Funding

The authors would like to thank R. A. C. M. M. Van Swaaij and J. Bezemer for supplying samples and many helpful discussions, and A. R. Hepburn, A. K. Browne and J. Jansen for valuable conversations and technical advice. This work was carried out, in part, under the ISC programme of the European Commission, contract CI1 *-CT93-0039.

FundersFunder number
European CommissionCI1 *-CT93-0039

    Keywords

    • Debye- Waller factor
    • Electron energy loss spectroscopy (EELS)
    • Extended energy loss fine structure (EXELFS) spectroscopy
    • Near neighbor
    • Transmission electron microscopy (TEM)
    • X-ray absorption fine structure (XAFS) analysis
    • χ-data

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