Abstract
A method is proposed for estimating the parameters (the mean-square height and characteristic distance between them) from data on light scattering from the investigated surface. The depth of the detected microroughnesses may reach 10** minus **6-10** minus **7 cm.
| Original language | English |
|---|---|
| Pages (from-to) | 1224-1226 |
| Number of pages | 3 |
| Journal | Instruments and Experimental Techniques |
| Volume | 19 |
| Issue number | 4 pt 2 |
| State | Published - 1976 |
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