Epitaxial growth of Y2O3:Eu thin films on LaAlO3

H. J. Gao, D. Kumar, K. G. Cho, P. H. Holloway, R. K. Singh, X. D. Fan, Y. Yan, S. J. Pennycook

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Abstract

We report the epitaxial growth of europium-activated yttrium oxide (Y2O3:Eu) (001) thin films on LaAlO3 (001) using laser ablation deposition at a substrate temperature of 775 °C and 10 Hz pulse repetition rate. The orientation relationship between the films and the substrates is [110]Y2O3∥[100]LaAlO3 and [-110]Y2O3∥[010]LaAlO3 which results in a lattice mismatch of only 0.8%. Transmission electron microscopy (TEM) of the films reveals the single crystalline Y2O3:Eu thin film to contain small pores. Scanning transmission electron microscopy (STEM) imaging of the films shows the substrate always terminates with the Al sublattice. Moreover, the STEM reveals that no precipitates of Eu had formed in the films.

Original languageEnglish
Pages (from-to)2223-2225
Number of pages3
JournalApplied Physics Letters
Volume75
Issue number15
DOIs
StatePublished - 11 Oct 1999
Externally publishedYes

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