Abstract
Europium-activated yttrium oxide (Eu:Y2O3) phosphor films have been grown in-situ on (100) bare silicon and diamond-coated silicon substrates using a pulsed laser deposition technique. Diamond-coated silicon substrates were prepared by hot filament chemical vapor deposition on (100) silicon wafer. Measurements of photoluminescence and cathodoluminescence properties of Eu:Y2O3 films showed that the films grown on diamond-coated silicon substrates are brighter than the films grown on bare silicon substrates. The improved brightness of the Eu:Y2O3 films on diamond-coated silicon substrates is attributed to reduced internal reflection and enhanced scattering of incident beam with lattice. These effects are primarily brought about by the presence of a rough diamond buffer layer between the phosphor film and substrate. Oxygen environment during deposition is necessary for better crystallinity but excess oxygenation of the Eu:Y2O3 films during cooling degrades the brightness of the films.
| Original language | English |
|---|---|
| Pages (from-to) | 301-306 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 508 |
| DOIs | |
| State | Published - 1998 |
| Externally published | Yes |
| Event | Proceedings of the 1998 MRS Spring Symposium - San Francisco, CA, USA Duration: 13 Apr 1998 → 15 Apr 1998 |
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