Energy/reliability trade-offs in low-voltage ReRAM-based non-volatile flip-flop design

Keyphrases

• Low Voltage 100%
• Flip-flop Design 100%
• Resistive Random Access Memory (ReRAM) 100%
• ReRAM Devices 100%
• Non-volatile Flip-flop 100%
• Energy Reliability 100%
• Leakage Power 66%
• Energy Dissipation 66%
• Write Energy 66%
• Monte Carlo Simulation 33%
• CMOS Technology 33%
• Supply Voltage 33%
• Low-voltage Operation 33%
• Total Power 33%
• Downscaling 33%
• Embedded Memory 33%
• Supply Voltage Scaling 33%
• On chip 33%
• Power Budget 33%
• Power Energy 33%
• Ultra-low Power 33%
• Subthreshold 33%
• Minimum Energy Point 33%
• Non-volatile 33%
• System-on-chip 33%
• VLSI Systems 33%
• Parametric Variation 33%
• Read Operation 33%
• Data Storage 33%
• Energy Characterization 33%
• Device Technology 33%
• Circuit Topology 33%
• Active Energy 33%
• Low Power VLSI 33%
• Data Restore 33%
• Status Register 33%
• T-operation 33%
• Sleep Period 33%
• Near-threshold 33%
• Zero Leakage 33%
• Flip-flop Circuit 33%

Engineering

• Energy Engineering 100%
• Flip Flop Circuits 100%
• Energy Dissipation 50%
• Supply Voltage 50%
• Resistive 25%
• Voltage Scaling 25%
• Electric Network Topology 25%
• System-on-Chip 25%
• Power Budget 25%
• Status Register 25%

Computer Science

• Nonvolatile 100%
• Supply Voltage 50%
• Energy Dissipation 50%
• Monte Carlo Simulation 25%
• Information Storage 25%
• embedded memory 25%
• System-on-Chip 25%
• Read Operation 25%
• Restore Operation 25%
• Resistive Memory 25%
• Status Register 25%