Embedded randomness and data dependencies design paradigm: Advantages and challenges

Itamar Levi; Yehuda Rudin; Alexander Fish; Osnat Keren

doi:10.23919/date.2018.8342042

Embedded randomness and data dependencies design paradigm: Advantages and challenges

Itamar Levi, Yehuda Rudin, Alexander Fish, Osnat Keren

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

Information leakage through physical channels is a major hurdle in embedded hardware security. This paper overviews the three key factors in the embedded hardware security space, focusing on gray-box (bounded resources) power analysis attacks: The adversary's knowledge and abilities, the security metrics used by adversaries' and security evaluators and gate-level countermeasures. A new design paradigm, dubbed pAsynch, that utilizes internal signals and random signals to uniformly spread the information-carrying energy within the clock period in a specific way with a resolution below the band-width and noise-filtering abilities of advanced measurement equipment is introduced. The advantages and design challenges introduced by the pAsynch paradigm are discussed.

Original language	English
Title of host publication	Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	395-400
Number of pages	6
ISBN (Electronic)	9783981926316
DOIs	https://doi.org/10.23919/date.2018.8342042
State	Published - 19 Apr 2018
Event	2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 - Dresden, Germany Duration: 19 Mar 2018 → 23 Mar 2018

Publication series

Name	Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Volume	2018-January

Conference

Conference	2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Country/Territory	Germany
City	Dresden
Period	19/03/18 → 23/03/18

Bibliographical note

Publisher Copyright:
© 2018 EDAA.

Keywords

hardware security
information leakage
pAsynch
pseudo asynchronous
side channel

Access to Document

10.23919/date.2018.8342042

Cite this

Levi, I., Rudin, Y., Fish, A., & Keren, O. (2018). Embedded randomness and data dependencies design paradigm: Advantages and challenges. In Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 (pp. 395-400). (Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/date.2018.8342042

Levi, Itamar ; Rudin, Yehuda ; Fish, Alexander et al. / Embedded randomness and data dependencies design paradigm : Advantages and challenges. Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 395-400 (Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018).

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abstract = "Information leakage through physical channels is a major hurdle in embedded hardware security. This paper overviews the three key factors in the embedded hardware security space, focusing on gray-box (bounded resources) power analysis attacks: The adversary's knowledge and abilities, the security metrics used by adversaries' and security evaluators and gate-level countermeasures. A new design paradigm, dubbed pAsynch, that utilizes internal signals and random signals to uniformly spread the information-carrying energy within the clock period in a specific way with a resolution below the band-width and noise-filtering abilities of advanced measurement equipment is introduced. The advantages and design challenges introduced by the pAsynch paradigm are discussed.",

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Levi, I, Rudin, Y, Fish, A & Keren, O 2018, Embedded randomness and data dependencies design paradigm: Advantages and challenges. in Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018. Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018, vol. 2018-January, Institute of Electrical and Electronics Engineers Inc., pp. 395-400, 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018, Dresden, Germany, 19/03/18. https://doi.org/10.23919/date.2018.8342042

Embedded randomness and data dependencies design paradigm: Advantages and challenges. / Levi, Itamar; Rudin, Yehuda; Fish, Alexander et al.
Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 395-400 (Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018; Vol. 2018-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Levi I, Rudin Y, Fish A , Keren O. Embedded randomness and data dependencies design paradigm: Advantages and challenges. In Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 395-400. (Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018). doi: 10.23919/date.2018.8342042

Embedded randomness and data dependencies design paradigm: Advantages and challenges

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

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