Electron beam-induced mass transport in As-Se thin films: Compositional dependence and glass network topological effects

M. L. Trunov, C. Cserháti, P. M. Lytvyn, Yu Kaganovskii, S. Kökényesi

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24 Scopus citations

Abstract

Electron beam (e-beam)-induced changes of surface profile morphology in AscSe1-c (0.2 < c < 0.5) thin films are investigated as a function of the film composition. It is shown that the extent and value of local surface alterations follow the composition-related changes of glass parameters such as softening temperature and glass network connectivity. The giant e-beam-induced surface relief changes detected in the films As0.2Se0.8 are connected with lateral mass transport, which increases drastically near rigidity transition, i.e. at a coordination number r ∼ 2.2 of the glass structures when the rigidity starts to percolate through the structure. The model of the process, which reflects the compositional dependence of the stimulated mass transport, is presented.

Original languageEnglish
Article number245303
JournalJournal of Physics D: Applied Physics
Volume46
Issue number24
DOIs
StatePublished - 19 Jun 2013

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