Abstract
The statistical and interference phenomena of electron and optical waves in random systems are classified in terms of four different length scales. The resulting five regimes are analyzed for electrons and electromagnetic waves. New statistical properties of optical waves in restricted geometries are discussed.
Original language | English |
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Pages (from-to) | 1-8 |
Number of pages | 8 |
Journal | Physica B: Condensed Matter |
Volume | 175 |
Issue number | 1-3 |
DOIs | |
State | Published - 1 Dec 1991 |