TY - JOUR
T1 - Electrodeposited layers of CuInS2, CuIn5S8 and CuInSe2
AU - Hodes, Gary
AU - Engelhard, Tina
AU - Herrington, Charles R.
AU - Kazmerski, Lawrence L.
AU - Cahen, David
PY - 1984
Y1 - 1984
N2 - CuInS2 and CuIn5S8 films on Ti substrates, were prepared by electrocodeposition of Cu, In and S, from an aqueous bath, followed by annealing in H2S. CuInS2 and CuInSe2 films could be prepared also be depositing a Cu-In alloy and converting it to the dichalcogenide by heating in H2S or H2Se. X-ray diffraction and microprobe analysis confirmed the structures and stoichiometries of the films. Their photovoltaic activity was tested using a polysulfide electrolyte/semiconductor junction. While only modest (up to 1.5%) white light conversion efficiencies were reached, something that is ascribed at least in part to the heterogeneity of the films, quantum efficiencies of up to 0.67 were measured at short-circuit.
AB - CuInS2 and CuIn5S8 films on Ti substrates, were prepared by electrocodeposition of Cu, In and S, from an aqueous bath, followed by annealing in H2S. CuInS2 and CuInSe2 films could be prepared also be depositing a Cu-In alloy and converting it to the dichalcogenide by heating in H2S or H2Se. X-ray diffraction and microprobe analysis confirmed the structures and stoichiometries of the films. Their photovoltaic activity was tested using a polysulfide electrolyte/semiconductor junction. While only modest (up to 1.5%) white light conversion efficiencies were reached, something that is ascribed at least in part to the heterogeneity of the films, quantum efficiencies of up to 0.67 were measured at short-circuit.
KW - CuInS
KW - CuInS
KW - CuInSe
KW - electrodeposition
KW - photoelectrochemistry
KW - polysulfide
KW - thin film
UR - http://www.scopus.com/inward/record.url?scp=0021570398&partnerID=8YFLogxK
U2 - 10.1016/0146-3535(84)90054-6
DO - 10.1016/0146-3535(84)90054-6
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AN - SCOPUS:0021570398
SN - 0146-3535
VL - 10
SP - 345
EP - 351
JO - Progress in Crystal Growth and Characterization
JF - Progress in Crystal Growth and Characterization
IS - C
ER -