Effects of roughness on the retroreflection from dielectric layers

D. G. Blumberg; V. Freilikher; I. Fuks; Yu Kaganovskii; A. A. Maradudin; M. Rosenbluh

doi:10.1088/0959-7174/12/3/302

Effects of roughness on the retroreflection from dielectric layers

D. G. Blumberg, V. Freilikher, I. Fuks, Yu Kaganovskii, A. A. Maradudin, M. Rosenbluh

Ben-Gurion University of the Negev

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

The backscattering of electromagnetic radiation from rough dielectric layers with strong reflectors is studied both theoretically and experimentally. The retroreflected intensity is calculated as a function of the angle of incidence for different polarizations and different parameters of layers. It is shown that the interference pattern is extremely sensitive to the long-scale component of the roughness. The theoretical results are in a good agreement with the measurements of light scattering. The results are discussed in the context of microwave subsurface remote sensing.

Original language	English
Pages (from-to)	279-292
Number of pages	14
Journal	Waves in Random and Complex Media
Volume	12
Issue number	3
DOIs	https://doi.org/10.1088/0959-7174/12/3/302
State	Published - Jul 2002
Externally published	Yes

Bibliographical note

Funding Information:
The work was supported in part by ONR grant no N0001 4001 0672.

Funding

The work was supported in part by ONR grant no N0001 4001 0672.

Funders	Funder number
Office of Naval Research	N0001 4001 0672

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10.1088/0959-7174/12/3/302

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title = "Effects of roughness on the retroreflection from dielectric layers",

abstract = "The backscattering of electromagnetic radiation from rough dielectric layers with strong reflectors is studied both theoretically and experimentally. The retroreflected intensity is calculated as a function of the angle of incidence for different polarizations and different parameters of layers. It is shown that the interference pattern is extremely sensitive to the long-scale component of the roughness. The theoretical results are in a good agreement with the measurements of light scattering. The results are discussed in the context of microwave subsurface remote sensing.",

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AU - Freilikher, V.

AU - Fuks, I.

AU - Kaganovskii, Yu

AU - Maradudin, A. A.

AU - Rosenbluh, M.

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Effects of roughness on the retroreflection from dielectric layers

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