Effects of roughness on the retroreflection from dielectric layers

D. G. Blumberg, V. Freilikher, I. Fuks, Yu Kaganovskii, A. A. Maradudin, M. Rosenbluh

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

The backscattering of electromagnetic radiation from rough dielectric layers with strong reflectors is studied both theoretically and experimentally. The retroreflected intensity is calculated as a function of the angle of incidence for different polarizations and different parameters of layers. It is shown that the interference pattern is extremely sensitive to the long-scale component of the roughness. The theoretical results are in a good agreement with the measurements of light scattering. The results are discussed in the context of microwave subsurface remote sensing.

Original languageEnglish
Pages (from-to)279-292
Number of pages14
JournalWaves in Random and Complex Media
Volume12
Issue number3
DOIs
StatePublished - Jul 2002
Externally publishedYes

Bibliographical note

Funding Information:
The work was supported in part by ONR grant no N0001 4001 0672.

Funding

The work was supported in part by ONR grant no N0001 4001 0672.

FundersFunder number
Office of Naval ResearchN0001 4001 0672

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