Abstract
Thin films of Co2MnSi (CMS) have been deposited on quartz and n-Si wafers using Pulsed Laser Deposition (PLD) by varying the deposition temperature at a fixed deposition time. A study has been done to understand how the structural and magnetic properties of CMS thin films depend on the substrates as well as on deposition substrate temperature. Without the help of any buffer/seed layer, good surfaced thin films are obtained. X-ray Diffraction represents polycrystalline peaks. In quartz, the peak intensity of the (220) phase peak increases with the substrate. In Silicon, another phase (400) is also seen that increases with the substrate temperature. The saturation magnetization is highest at 600°C growth temperature for the quartz substrate. In Silicon, we find a decrease in the saturation magnetization due to the phase transition.
Original language | English |
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Title of host publication | 2nd International Conference on Mechanical Materials and Renewable Energy, ICMMRE 2019 |
Editors | Xiao-Zhi Gao, Ranjan Kumar Ghadai, Kana Kalita, Ishwer Shivakoti, Erol Kilickap, Tanmoy Kundu, Soham Das |
Publisher | American Institute of Physics Inc. |
ISBN (Electronic) | 9780735440036 |
DOIs | |
State | Published - 2 Nov 2020 |
Externally published | Yes |
Event | 2nd International Conference on Mechanical Materials and Renewable Energy, ICMMRE 2019 - East Sikkim, India Duration: 6 Dec 2019 → 7 Dec 2019 |
Publication series
Name | AIP Conference Proceedings |
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Volume | 2273 |
ISSN (Print) | 0094-243X |
ISSN (Electronic) | 1551-7616 |
Conference
Conference | 2nd International Conference on Mechanical Materials and Renewable Energy, ICMMRE 2019 |
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Country/Territory | India |
City | East Sikkim |
Period | 6/12/19 → 7/12/19 |
Bibliographical note
Publisher Copyright:© 2020 Author(s).
Keywords
- Atomic force microscope and vibrating sample magnetometer
- Co2mnsi (cms) thin films
- Heusler alloys
- Pulsed laser deposition
- X-ray diffraction