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Effect of Speckle Size in Edge Point Referencing for Deformation Measurement

  • Surya Kumar Gautam
  • , Vikas
  • , Rajesh Kumar
  • , S. S.K. Titus
  • , Panchal Pramod
  • , Dinesh N. Naik

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

When an object is subjected to mechanical or thermal loading, the surface of object deforms. Deformation of the object can be measured using holography techniques. However, the holography technique is restricted due to the requirement of a vibration isolation system to keep the reference beam stable. Without the reference beam, we can only obtain the autocorrelation from an intensity recorded in the Fourier plane. In a previous study, we proposed that object information can be retrieved by utilizing a phase retrieval iterative algorithm or by recording two shots by modifying the field near the edge of the object by incorporating edge point referencing. We also demonstrated that deformation can be sensed in a single shot by increasing the intensity of the additional beam. In this paper, we explore how the quality of the deformation measurement is affected if the beam illuminating the edge of the object is not tightly focused.

Original languageEnglish
Title of host publicationAdvances in Biophotonics, Nanofabrication, Optical Metrology and Nonlinear and Ultrafast Photonics - Proceedings of PHOTONICS 2023
EditorsJaya Prakash, Jaydeep Kumar Basu, Sebabrata Mukherjee, C.M. Chandrashekar
PublisherSpringer Science and Business Media Deutschland GmbH
Pages49-58
Number of pages10
ISBN (Print)9789819779161
DOIs
StatePublished - 2025
Externally publishedYes
EventInternational Conference on Photonics, PHOTONICS 2023 - Bangalore, India
Duration: 5 Jul 20238 Jul 2023

Publication series

NameLecture Notes in Electrical Engineering
Volume1242 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

ConferenceInternational Conference on Photonics, PHOTONICS 2023
Country/TerritoryIndia
CityBangalore
Period5/07/238/07/23

Bibliographical note

Publisher Copyright:
© The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2025.

Keywords

  • Complex object reconstruction
  • Deformation measurement
  • Edge point referencing
  • Holography
  • Phase reconstruction

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