Abstract
When an object is subjected to mechanical or thermal loading, the surface of object deforms. Deformation of the object can be measured using holography techniques. However, the holography technique is restricted due to the requirement of a vibration isolation system to keep the reference beam stable. Without the reference beam, we can only obtain the autocorrelation from an intensity recorded in the Fourier plane. In a previous study, we proposed that object information can be retrieved by utilizing a phase retrieval iterative algorithm or by recording two shots by modifying the field near the edge of the object by incorporating edge point referencing. We also demonstrated that deformation can be sensed in a single shot by increasing the intensity of the additional beam. In this paper, we explore how the quality of the deformation measurement is affected if the beam illuminating the edge of the object is not tightly focused.
| Original language | English |
|---|---|
| Title of host publication | Advances in Biophotonics, Nanofabrication, Optical Metrology and Nonlinear and Ultrafast Photonics - Proceedings of PHOTONICS 2023 |
| Editors | Jaya Prakash, Jaydeep Kumar Basu, Sebabrata Mukherjee, C.M. Chandrashekar |
| Publisher | Springer Science and Business Media Deutschland GmbH |
| Pages | 49-58 |
| Number of pages | 10 |
| ISBN (Print) | 9789819779161 |
| DOIs | |
| State | Published - 2025 |
| Externally published | Yes |
| Event | International Conference on Photonics, PHOTONICS 2023 - Bangalore, India Duration: 5 Jul 2023 → 8 Jul 2023 |
Publication series
| Name | Lecture Notes in Electrical Engineering |
|---|---|
| Volume | 1242 LNEE |
| ISSN (Print) | 1876-1100 |
| ISSN (Electronic) | 1876-1119 |
Conference
| Conference | International Conference on Photonics, PHOTONICS 2023 |
|---|---|
| Country/Territory | India |
| City | Bangalore |
| Period | 5/07/23 → 8/07/23 |
Bibliographical note
Publisher Copyright:© The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2025.
Keywords
- Complex object reconstruction
- Deformation measurement
- Edge point referencing
- Holography
- Phase reconstruction
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