Effect of long-scale roughness in light scattering from slightly rough dielectric layers

Yu S. Kaganovskii, V. D. Freilikher, M. Rosenbluh

Research output: Contribution to conferencePaperpeer-review

Abstract

An experiment was conducted to demonstrate that the long-scale component of the roughness spectrum (LSR) is responsible for determining the ring positions and their dependence on incidence and scattering angle, even though the presence of the interference rings is made possible mostly by the light scattered by the small-scale roughness (SSR). The experiment used 2-mm diameter beams from an He-Ne and/or argon-ion laser, and microscope cover-glass plates and Fabry-Perot plates. The measured scattered distribution were compared with those calculated in the first Born approximation. Good quantitative agreement was found with the measurements of the scattered intensity from the slightly rough Fabry-Perot plates.

Original languageEnglish
Pages179-180
Number of pages2
StatePublished - 1998
EventProceedings of the 1998 International Quantum Electronics Conference - San Francisco, CA, USA
Duration: 3 May 19988 May 1998

Conference

ConferenceProceedings of the 1998 International Quantum Electronics Conference
CitySan Francisco, CA, USA
Period3/05/988/05/98

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