TY - JOUR
T1 - Effect of fluctuations on the reflectivity near the angle of total internal reflection
AU - Freilikher, V.
AU - Fuks, I.
AU - Pustilnik, M.
PY - 1995/1/1
Y1 - 1995/1/1
N2 - Wave propagation in the presence of a rough dielectric interface with total internal reflection is studied theoretically using the Kirchhoff approximation. An approximate expression valid when the surface is smooth enough is obtained for the mean intensity of a point source as a function of propagation range and statistical parameters of a surface. It is shown that if the characteristic angle of incidence is close to the angle of total internal reflection, small irregularities of interface can drastically change the reflectivity and, consequently, the signal level far away from the source. As an example, far beyond the horizon propagation of radiowaves in the presence of elevated irregular reflecting layers in the atmosphere is discussed.
AB - Wave propagation in the presence of a rough dielectric interface with total internal reflection is studied theoretically using the Kirchhoff approximation. An approximate expression valid when the surface is smooth enough is obtained for the mean intensity of a point source as a function of propagation range and statistical parameters of a surface. It is shown that if the characteristic angle of incidence is close to the angle of total internal reflection, small irregularities of interface can drastically change the reflectivity and, consequently, the signal level far away from the source. As an example, far beyond the horizon propagation of radiowaves in the presence of elevated irregular reflecting layers in the atmosphere is discussed.
UR - http://www.scopus.com/inward/record.url?scp=84894006218&partnerID=8YFLogxK
U2 - 10.1163/156939395x00776
DO - 10.1163/156939395x00776
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AN - SCOPUS:84894006218
SN - 0920-5071
VL - 9
SP - 1141
EP - 1148
JO - Journal of Electromagnetic Waves and Applications
JF - Journal of Electromagnetic Waves and Applications
IS - 9
ER -