Abstract
A theoretical study is made of the effect of fluctuations of the composition of Ge//1// minus //xSi//x solid solutions on the hole mobility. The measurements of the temperature dependence of the mobility are quoted for a series of p-type Ge//1// minus //xSi//x samples (0. 004 less than equivalent to x less than equivalent to 0. 08) with identical impurity compositions. A comparison of the experimental and calculated results indicates that Si is contained in Ge in the form of clusters of K atoms rather than single atoms, where K equals 30-150. This conclusion is consistent with the data on the hopping conductivity of such samples.
| Original language | English |
|---|---|
| Pages (from-to) | 149-151 |
| Number of pages | 3 |
| Journal | Soviet physics. Semiconductors |
| Volume | 11 |
| Issue number | 2 |
| State | Published - 1977 |
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