Effect of chemical treatments on nm-scale electrical characteristics of polycrystalline thin film Cu(In,Ga)Se2 surfaces

Wenjie Li, Sidney R. Cohen, David Cahen

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

Conducting Probe AFM. CP-AFM, was used to follow how chemical etching, oxidation, and sulfurization affect the surface nanoscale electrical characteristics of polycrystalline Cu(In,Ga)Se2 (CIGS) thin films. Band bending at grain boundaries (GBs) on the surface was studied and analyzed by CP-AFM - measured photocurrents. We find that both oxidation and sulfurization can passivate the GBs of the CIGS films; oxidation increases n-type band bending, which impedes the transport of photogenerated electrons, while sulfurization increases p-type band bending at GBs, which helps this transport. Differences in effects between surface terminations by sulfide, selenide and oxide were analyzed. The effects of these treatments on the electrical activity of the GBs of the films, as well as the importance of the use of chemical bath deposition of the CdS buffer, are explained within a defect surface chemistry model.

Original languageEnglish
Pages (from-to)500-505
Number of pages6
JournalSolar Energy Materials and Solar Cells
Volume120
Issue numberPART B
DOIs
StatePublished - Jan 2014
Externally publishedYes

Keywords

  • Oxidation
  • Selenization
  • Solar cells
  • Sulfurization
  • Surface treatment

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