Effect of As doping on the photoluminescence of nanocrystalline 74Ge embedded in SiO2 matrix

Shaobo Dun, Tiecheng Lu, Youwen Hu, Qiang Hu, Liuqi Yu, Zheng Li, Ningkang Huang, Songbao Zhang, Bin Tang, Junlong Dai, Lev Resnick, Issai Shlimak

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15 Scopus citations

Abstract

Samples of nanocrystalline 74Ge embedded in amorphous SiO2 film were prepared by 74Ge ion implantation and subsequent primary thermal annealing. These samples were irradiated by neutron flux in a nuclear reactor then the second annealing followed. Irradiation with thermal neutrons leads to doping of nanocrystalline 74Ge with As impurities due to nuclear transmutation of isotope 74Ge into 75As. Transmission electron microscope, X-ray fluorescence, X-ray photoelectron spectroscopy, laser Raman scattering and photoluminescence of the obtained samples were measured. It was observed that with the increase in As-donors concentration, photoluminescence intensity first increased but then significantly decreased. An explanatory model of this non-monotonic behavior was discussed.

Original languageEnglish
Pages (from-to)1363-1368
Number of pages6
JournalJournal of Luminescence
Volume128
Issue number8
DOIs
StatePublished - Aug 2008
Externally publishedYes

Bibliographical note

Funding Information:
This research was supported by a Grant #3-405 from the Ministry of Science and Technology, Israel, within the Cooperation Program with the Ministry of Science and Technology, China and NASF of NSFC-CAEP of China (no. 10376020), as well as Program for New Century Excellent Talents in University, China (no. NCET-04-0874). The authors thank A.N. Ionov and I. Lazebnik for their help in sample irradiation with a neutron flux in a research nuclear reactor; also thank Kai Sun and Lumin Wang for their help in XPS and TEM measurements and results discussion. L.R. and I.S. are thankful to the Erick and Sheila Samson Chair of Semiconductor Technology for the financial support.

Funding

This research was supported by a Grant #3-405 from the Ministry of Science and Technology, Israel, within the Cooperation Program with the Ministry of Science and Technology, China and NASF of NSFC-CAEP of China (no. 10376020), as well as Program for New Century Excellent Talents in University, China (no. NCET-04-0874). The authors thank A.N. Ionov and I. Lazebnik for their help in sample irradiation with a neutron flux in a research nuclear reactor; also thank Kai Sun and Lumin Wang for their help in XPS and TEM measurements and results discussion. L.R. and I.S. are thankful to the Erick and Sheila Samson Chair of Semiconductor Technology for the financial support.

FundersFunder number
NASF
NSFC-CAEP of China10376020
Ministry of Science and Technology of the People's Republic of China
Program for New Century Excellent Talents in UniversityNCET-04-0874
Ministry of science and technology, Israel

    Keywords

    • Doping
    • Nanocrystals
    • Photoluminescence
    • Quenching

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