Abstract
Samples of nanocrystalline 74Ge embedded in amorphous SiO2 film were prepared by 74Ge ion implantation and subsequent primary thermal annealing. These samples were irradiated by neutron flux in a nuclear reactor then the second annealing followed. Irradiation with thermal neutrons leads to doping of nanocrystalline 74Ge with As impurities due to nuclear transmutation of isotope 74Ge into 75As. Transmission electron microscope, X-ray fluorescence, X-ray photoelectron spectroscopy, laser Raman scattering and photoluminescence of the obtained samples were measured. It was observed that with the increase in As-donors concentration, photoluminescence intensity first increased but then significantly decreased. An explanatory model of this non-monotonic behavior was discussed.
Original language | English |
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Pages (from-to) | 1363-1368 |
Number of pages | 6 |
Journal | Journal of Luminescence |
Volume | 128 |
Issue number | 8 |
DOIs | |
State | Published - Aug 2008 |
Externally published | Yes |
Bibliographical note
Funding Information:This research was supported by a Grant #3-405 from the Ministry of Science and Technology, Israel, within the Cooperation Program with the Ministry of Science and Technology, China and NASF of NSFC-CAEP of China (no. 10376020), as well as Program for New Century Excellent Talents in University, China (no. NCET-04-0874). The authors thank A.N. Ionov and I. Lazebnik for their help in sample irradiation with a neutron flux in a research nuclear reactor; also thank Kai Sun and Lumin Wang for their help in XPS and TEM measurements and results discussion. L.R. and I.S. are thankful to the Erick and Sheila Samson Chair of Semiconductor Technology for the financial support.
Funding
This research was supported by a Grant #3-405 from the Ministry of Science and Technology, Israel, within the Cooperation Program with the Ministry of Science and Technology, China and NASF of NSFC-CAEP of China (no. 10376020), as well as Program for New Century Excellent Talents in University, China (no. NCET-04-0874). The authors thank A.N. Ionov and I. Lazebnik for their help in sample irradiation with a neutron flux in a research nuclear reactor; also thank Kai Sun and Lumin Wang for their help in XPS and TEM measurements and results discussion. L.R. and I.S. are thankful to the Erick and Sheila Samson Chair of Semiconductor Technology for the financial support.
Funders | Funder number |
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NASF | |
NSFC-CAEP of China | 10376020 |
Ministry of Science and Technology of the People's Republic of China | |
Program for New Century Excellent Talents in University | NCET-04-0874 |
Ministry of science and technology, Israel |
Keywords
- Doping
- Nanocrystals
- Photoluminescence
- Quenching