Economics and yield potential of wheat (Triticum aestivum) as affected by tillage, rice (Oryza sativa) residue and nitrogen management options under rice-wheat system

Sandeep Kumar, D. S. Pandey, N. S. Rana

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

A field trial was conducted during 1999-2000 and 2000-2001 at Pantnagar, to find out the economics and yield potential of wheat (Triticum aestivum L. emend. Fiori & Paol.] as affected by tillage, rice (Oryza sativa L.) residue and nitrogen management options. Deep incorporation of rice residue either by disc plough or by mould-board plough proved a better option for effective disposal of rice residue and recorded significantly higher grain yield as well as net returns of wheat. Further, conservation tillage (zero and strip) being at par with in-situ residue burned plot ploughed with traditional tillage recorded higher grain yield and net returns than residue removed plot prepared with traditional tillage. Besides production of significantly smaller grains and 15-23% lower initial plant population, conservation tillage recorded the highest grain growth rate, benefit:cost ratio and saved up to Rs/ha 1,821 under land preparation over traditional tillage. Application of 75% of the recommended dose of N as basal and rest 25% at crown-root initiation could offset the effect of an additional starter dose of 20 kg N/ha given along with recommended dose of N applied into 2 equal halves at sowing and crown-root initiation.

Original languageEnglish
Pages (from-to)102-105
Number of pages4
JournalIndian Journal of Agronomy
Volume50
Issue number2
StatePublished - Jun 2005
Externally publishedYes

Keywords

  • Economics
  • Nitrogen
  • Residue
  • Rice-wheat
  • Tillage
  • Wheat

Fingerprint

Dive into the research topics of 'Economics and yield potential of wheat (Triticum aestivum) as affected by tillage, rice (Oryza sativa) residue and nitrogen management options under rice-wheat system'. Together they form a unique fingerprint.

Cite this