E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

H. Cohen; C. Nogues; I. Zon; I. Lubomirsky

doi:10.1063/1.1900296

E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

H. Cohen
, C. Nogues
, I. Zon
, I. Lubomirsky

Department of Chemical Research Support
Weizmann Institute of Science

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Abstract

A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.

Original language	English
Article number	113701
Journal	Journal of Applied Physics
Volume	97
Issue number	11
DOIs	https://doi.org/10.1063/1.1900296
State	Published - 2005
Externally published	Yes

Access to Document

10.1063/1.1900296

Cite this

@article{d628fd1551b2426c99fbdbd39bcfc4e6,

title = "E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer",

abstract = "A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.",

author = "H. Cohen and C. Nogues and I. Zon and I. Lubomirsky",

year = "2005",

doi = "10.1063/1.1900296",

language = "אנגלית",

volume = "97",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "11",

}

TY - JOUR

T1 - E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

AU - Cohen, H.

AU - Nogues, C.

AU - Zon, I.

AU - Lubomirsky, I.

PY - 2005

Y1 - 2005

N2 - A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.

AB - A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.

UR - https://www.scopus.com/pages/publications/20544441457

U2 - 10.1063/1.1900296

DO - 10.1063/1.1900296

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:20544441457

SN - 0021-8979

VL - 97

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 11

M1 - 113701

ER -

E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

Abstract

Access to Document

Other files and links

Fingerprint

Cite this