E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

H. Cohen; C. Nogues; I. Zon; I. Lubomirsky

doi:10.1063/1.1900296

E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

H. Cohen, C. Nogues, I. Zon, I. Lubomirsky

Weizmann Institute of Science

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.

Original language	English
Article number	113701
Journal	Journal of Applied Physics
Volume	97
Issue number	11
DOIs	https://doi.org/10.1063/1.1900296
State	Published - 2005
Externally published	Yes

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abstract = "A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.",

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E-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer

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