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Dopant electromigration in semiconductors
David Cahen, Leonid Chernyak
Weizmann Institute of Science
Intel
Research output
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Contribution to journal
›
Article
›
peer-review
46
Scopus citations
Overview
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Keyphrases
Semiconductors
100%
Dopant
100%
Electromigration
100%
Dopant Drift
40%
Dopant Diffusion
40%
High Temperature
20%
Low Temperature
20%
Behavior Change
20%
Temperature Range
20%
Doping Concentration
20%
Diamond
20%
Si(Li)
20%
Related Compounds
20%
Optoelectronic Properties
20%
Concentration Change
20%
Doped Semiconductor
20%
Electric-field-induced
20%
Device Stability
20%
Mixed Ionic-electronic Conductor
20%
II-VI
20%
Radiation Detectors
20%
Mobile Ions
20%
Device Miniaturization
20%
CuInSe2
20%
Ambipolar Behavior
20%
Material Science
Doping (Additives)
100%
Electronic Property
12%
Diamond
12%
Solid Electrolyte
12%