Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique

Meir Grajower; Liron Stern; Boris Desiatov; Ilya Goykhman; Uriel Levy

doi:10.1364/cleo_si.2014.sm2h.1

Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique

Meir Grajower, Liron Stern, Boris Desiatov, Ilya Goykhman, Uriel Levy

Hebrew University of Jerusalem

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	Science and Innovations, CLEO_SI 2014
Publisher	Optical Society of America (OSA)
ISBN (Print)	9781557529992, 9781557529992
DOIs	https://doi.org/10.1364/cleo_si.2014.sm2h.1
State	Published - 2014
Externally published	Yes
Event	CLEO: Science and Innovations, CLEO_SI 2014 - San Jose, CA, United States Duration: 8 Jun 2014 → 13 Jun 2014

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	CLEO: Science and Innovations, CLEO_SI 2014
Country/Territory	United States
City	San Jose, CA
Period	8/06/14 → 13/06/14

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10.1364/cleo_si.2014.sm2h.1

Cite this

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title = "Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique",

abstract = "We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.",

author = "Meir Grajower and Liron Stern and Boris Desiatov and Ilya Goykhman and Uriel Levy",

year = "2014",

doi = "10.1364/cleo_si.2014.sm2h.1",

language = "אנגלית",

isbn = "9781557529992",

series = "Optics InfoBase Conference Papers",

publisher = "Optical Society of America (OSA)",

booktitle = "CLEO",

note = "CLEO: Science and Innovations, CLEO_SI 2014 ; Conference date: 08-06-2014 Through 13-06-2014",

}

Grajower, M, Stern, L, Desiatov, B, Goykhman, I & Levy, U 2014, Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique. in CLEO: Science and Innovations, CLEO_SI 2014. Optics InfoBase Conference Papers, Optical Society of America (OSA), CLEO: Science and Innovations, CLEO_SI 2014, San Jose, CA, United States, 8/06/14. https://doi.org/10.1364/cleo_si.2014.sm2h.1

Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique. / Grajower, Meir; Stern, Liron; Desiatov, Boris et al.
CLEO: Science and Innovations, CLEO_SI 2014. Optical Society of America (OSA), 2014. (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Levy, Uriel

PY - 2014

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Y2 - 8 June 2014 through 13 June 2014

ER -

Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique

Abstract

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