Direct determination of the stacking order in Gd2O3 epi-layers on GaAs

Yizhak Yacoby, Mukhles Sowwan, Ron Pindak, Julie Cross, Don Walko, Ed Stern, John Pitney, Robert MacHarrie, Minghwei Hong, Roy Clarke

Research output: Contribution to journalConference articlepeer-review

Abstract

We have used Coherent Bragg Rod Analysis (COBRA) to investigate the atomic structure of a 5.6 nm thick Gd2O3 film epitaxially grown on a (100) GaAs substrate. COBRA is a method to directly obtain the structure of systems periodic in two-dimensions by determining the complex scattering factors along the substrate Bragg rods. The system electron density and atomic structure are obtained by Fourier transforming the complex scattering factors into real space. The results show that the stacking order of the first seven Gd2O3 film layers resembles the stacking order of Ga and As layers in GaAs then changes to the stacking order of cubic bulk Gd2O3. This behavior is distinctly different from the measured stacking order in a 2.7 nm thick Gd2O3 in which the GaAs stacking order persists throughout the entire film.

Original languageEnglish
Pages (from-to)173-178
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume751
StatePublished - 2003
Externally publishedYes
EventStructure-Property Relationships of Oxide Surfaces and Interfaces II - Boston, MA, United States
Duration: 2 Dec 20023 Dec 2002

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