Abstract
A method of directly obtaining radial distribution functions (RDF) from XAFS measurements is discussed. This method uses the cumulant expansion to reconstruct low k XAFS data and a Fourier transform to obtain the RDF. Applications of the method to Al-Mn-Si alloys are discussed in detail. We especially note that errors in the low k extrapolation have little effect on the shape of the RDF and can be minimized by imposing the positive-definite nature of the RDF.
Original language | English |
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Pages (from-to) | 268-272 |
Number of pages | 5 |
Journal | Physica B: Condensed Matter |
Volume | 158 |
Issue number | 1-3 |
DOIs | |
State | Published - Jun 1989 |
Externally published | Yes |