A method of directly obtaining radial distribution functions (RDF) from XAFS measurements is discussed. This method uses the cumulant expansion to reconstruct low k XAFS data and a Fourier transform to obtain the RDF. Applications of the method to Al-Mn-Si alloys are discussed in detail. We especially note that errors in the low k extrapolation have little effect on the shape of the RDF and can be minimized by imposing the positive-definite nature of the RDF.
|Number of pages||5|
|Journal||Physica B: Condensed Matter|
|State||Published - Jun 1989|